Generally spoken, development in metrology always means to extend the degree of information that can be gathered about an object, or to reduce the costs per unit of measured information. This development can be seen today first of all in the following future trends and new applications: • holistic measurement (multi-sensor metrology, integral measurement with CT, 100% testing)
• Micro / Nano metrology
• cost reduction of standard measurements (quicker, cheaper, more robust and easier to use)
The today used tactile methods are to be complemented or partly replaced by optical 3D measurements depending on needed accuracy and surface properties since they offer the possibility to acquire more points in shorter time. These higher point densities will lead to shorter inspection times in association with increased reliability of the acquired information. Challenging is still to raise the robustness of optical metrology towards optical properties of the work piece and to improve the ease of use in a way that even unskilled personnel is able to achieve valid results with small uncertainty.